Equipment and Module
Equipment and Module
Intertec Taiwan Corp has been started operation on 2001 and specializes in the buying and selling used equipment including Semiconductor, III-V compounds, LED, Diode, MEMS and TFT-LCD Industrial. We are selling high quality refurbished wafer process equipment including stepper, Track and CDSEM…etc. Our Service Technical team has multiple years of experience in modification, retrofit, customized design, trouble shooting and installation. We can delivery win-win solution to our customer to meet requirement and target.
| No | Category | Tool Name | Maker | Model | Size | Vintage | REMARKS | |
|---|---|---|---|---|---|---|---|---|
| F1 | LITHOGRAPHY | ALIGNER | CANON | MPA600FA | 6 | |||
| F2 | LITHOGRAPHY | ALIGNER | CANON | MPA600SUPER | 6 | 1995 | ||
| F3 | LITHOGRAPHY | ALIGNER | CANON | PLA501F | ||||
| F4 | LITHOGRAPHY | ALIGNER | CANON | PLA501FA | 5 | |||
| F5 | LITHOGRAPHY | ALIGNER | CANON | PLA600F | 6 | |||
| F6 | LITHOGRAPHY | ALIGNER | SUSS | MA150e | 6 | 2008 | ||
| F7 | LITHOGRAPHY | ALIGNER | UNIHITE SYSTEM | PEM1000AL | 4 | |||
| F8 | LITHOGRAPHY | STEPPER | CANON | FPA3000i5 | 8 | refurbish | ||
| F9 | LITHOGRAPHY | STEPPER | CANON | FPA3000iw | 8 | |||
| F10 | LITHOGRAPHY | STEPPER | NIKON | NSR-2205i11C | 8 | 1998 | ||
| F11 | LITHOGRAPHY | STEPPER | NIKON | NSR-2205i12D | 6 | |||
| F12 | LITHOGRAPHY | STEPPER | NIKON | NSR-2205i14E2 | 6 | 2007 | ||
| F13 | LITHOGRAPHY | COATER | DNS | SK-60BW-AVP | 3,4 | 2000 | ||
| F14 | LITHOGRAPHY | COATER | SUSS | ACS200Gen3 | 8 | 2019 | 1 Coat | |
| F15 | LITHOGRAPHY | COATER_DEVELOPER | SUSS | ACS200Gen3 | 8 | 2018 | 2 Coat, 2 Dev | |
| F16 | LITHOGRAPHY | UV_CURE | TOK | TVC-8011 | 3 | |||
| F17 | LITHOGRAPHY | UV_CURE | USHIO | UMA-1002-HC93NS | 8 | 1997 | ||
| F18 | LITHOGRAPHY | UV_CURE | USHIO | UMA-1002-HC93JF | 8 | 2001 | ||
| F19 | LITHOGRAPHY | LIFT-OFF MACHINE | TAKATORI | AMR-2200G | 4 | |||
| F20 | DEPOSITION | LPCVD | KOKUSAI | DJ-833V | 6 | |||
| F21 | DEPOSITION | LPCVD | KOKUSAI | DJ-853V | 6 | 2008 | ||
| F22 | DEPOSITION | PECVD | SAMCO | PD-3800L | 3 | 2010‐2012 | 2sets 3 inch x 13 trays | |
| F23 | DEPOSITION | SPUTTER | ANELVA | C-7730FH | 4 | 2003 | ||
| F24 | DEPOSITION | SPUTTER | ULVAC | CERAUS Z-1000 | 5 | |||
| F25 | DEPOSITION | SPUTTER | ULVAC | SRH-420MC | 6 | |||
| F26 | DEPOSITION | EVAPORATOR | ULVAC | ei-5 | 角基板 | 2006 | ||
| F27 | DEPOSITION | EVAPORATOR | ULVAC | ei-5 | 角基板 | 2006 | ||
| F28 | ETCHER | ASHER | CANON | MAS8220 | 6、8 | |||
| F29 | ETCHER | ASHER | YAMATO | V1000X | 4 | parts machine | ||
| F30 | ETCHER | ETCHER | AMAT | P-5000 | 6 | |||
| F31 | ETCHER | ETCHER | TOK | TCA-7822S | 6 | 2008 | ||
| F32 | ETCHER | ETCHER | TOK | TCE7822 | 8 | |||
| F33 | ETCHER | ETCHER | ULVAC | CD-300R | 2~6 | Defective | ||
| F34 | ETCHER | ETCHER | ULVAC | NE-950EX | 4 | 2014 | GaN | |
| F35 | ETCHER | METAL_ETCHER | ULVAC | NE-5500 | 3 | |||
| F36 | ETCHER | POLY EHCHER | AMAT | Centura DPS | 6 | 2008 | ||
| F37 | IMPLANT | HIGH_CURRENT_IMPLANTER | VARIAN | 160XP | 6 | |||
| F38 | CLEAN | OZONE CLEANING | AQUA SCIENCE | Aurora AU2-001 | 6 | |||
| F39 | CLEAN | RINSER_DRYER | NSD3000 | 4 | ||||
| F40 | CLEAN | SCRUBBER | DAITRON | WJS-200C | 2018 | Wafer jet scurbber | ||
| F41 | CLEAN | SPIN_DRYER | SEMICON CREATED | SCC-800A | 6 | 2019 | ||
| F42 | CLEAN | SPIN_DRYER | SEMICON CREATED | SCC-800A | 6 | 2019 | ||
| F43 | CLEAN | WET STATION | DNS | CW1500 | 6 | 2010 | ||
| F44 | METROLOGY | SEM | JEOL | 6380LV | with EDX and EBIC | |||
| F45 | METROLOGY | SEM | JEOL | JWS-7555S | 8 | 2000 | power unit, with pump | |
| F46 | METROLOGY | CDSEM | HITACHI | S-8620 | 6 | refurbish | ||
| F47 | METROLOGY | CDSEM | HITACHI | S-8620 | 6 | refurbish | ||
| New | F48 | METROLOGY | CDSEM | HITACHI | S-8620 | 6 | refurbish | |
| F49 | METROLOGY | CDSEM | HITACHI | S-9200 | 8 | refurbish | ||
| F50 | METROLOGY | CDSEM | HITACHI | S-9260A | 8 | refurbish | ||
| F51 | METROLOGY | CDSEM | HITACHI | S-9380II | 12 | 2005 | ||
| F52 | METROLOGY | FESEM | HITACHI | SU-8000 | refurbish | |||
| F53 | METROLOGY | PL MAPPING | NANOMETRICS | VERTEX-SM-110 | manual | |||
| F54 | METROLOGY | FILM_THICKNESS_MEASUREMENT | DNS | RE-3100 | 8 | |||
| F55 | METROLOGY | FILM_THICKNESS_MEASUREMENT | DNS | VM-1210 | 6 | 2005 | ||
| F56 | METROLOGY | PROFILER | KLA TENCOR | P-2H | 6 | Long scan profiler | ||
| F57 | METROLOGY | DUAL SIDE ALIGNMENT | VEECO | ULTRAMET100 | ||||
| F58 | METROLOGY | FTIR | JASCO | FTIR6100 | 4 | |||
| F59 | METROLOGY | DROP SHAPE ANALYZER | KRUSS | DSA100 | ～12 | 2003 | ||
| New | F60 | METROLOGY | Xray | RIGAKU | XRTmicron | 6、8、12 | 2013 | |
| F61 | METROLOGY | X-RAY 3D-CT SYSTEM | UNIHITE SYSTEM | XVA-160 | 角基盤 | 2008 | 300mm?300mm | |
| F62 | METROLOGY | LOADER | OLYMPUS | AL Series | 4、5 | |||
| F63 | METROLOGY | LOADER | OLYMPUS | AL Series | 5、6 | |||
| F64 | METROLOGY | LOADER | OLYMPUS | AL Series | 6、8 | |||
| F65 | METROLOGY | MICROSCOPE WITH LOADE | NIKON | Eclipse L200N + NWL860 | 6 | |||
| F66 | METROLOGY | MICROSCOPE WITH LOADE | NIKON | Eclipse L200A + NWL200 | 6 | |||
| F67 | METROLOGY | MICROSCOPE WITH LOADE | NIKON | Eclipse L200A + NWL200 | 6 | |||
| New | F68 | METROLOGY | WAFER PATTERN INSPECTION | SCREEN SEMICONDUCTOR SOLUTIONS | ZI-2000 | 8 | 2018 | |
| B1 | ATE | TESTER | ADVANTEST | T6573 | ||||
| B2 | ATE | TESTER | ADVANTEST | T6575 | 2003 | 512pin | ||
| B3 | ATE | TESTER | ADVANTEST | T6577 | ||||
| B4 | ATE | TESTER | AGILENT | HP4072A | 2001 | |||
| B5 | ATE | TESTER | AGILENT | HP4072B | 2007 | 48pin,MPSMUx8 | ||
| B6 | ATE | TESTER | AGILENT | HP4073A | 2001 | 48pin,HR-SMUx2.MP-SMUx6 | ||
| B7 | ATE | TESTER | AGILENT | HP4082 | ||||
| B8 | ATE | TESTER | SHIBASOKU | WL0500A | 2008 | junk | ||
| B9 | ATE | TESTER | SHIBASOKU | WL15V | 2018 | |||
| B10 | ATE | TESTER | SHIBASOKU | WL25 | 2008 | |||
| B11 | ATE | PROBER | MJC | MP-10 | 8φ200mm | manual | ||
| B12 | ATE | PROBER | OMNIPHYSICS | SE-1000 | 5φ130mm | manual | ||
| B13 | ATE | PROBER | OMNIPHYSICS | SE-6003A | 8 | manual | ||
| B14 | ATE | PROBER | TEL | PRECIO | 2011 | |||
| B15 | ATE | PROBER | TSK | UF3000 | 12 | 2004 | ||
| B16 | ATE | PROBER | TSK | UF3000 | 12 | 2006 | ||
| B17 | ATE | HANDLER | COHU | JAGUAR | 2018 | 2 sets | ||
| B18 | ATE | HANDLER | SEIKO EPSON | NS8080W | 2012 | |||
| B19 | ATE | CHILLER | TSK | SCU-500S | 2004 | for UF200 | ||
| B20 | ATE | CHILLER | TSK | SCU-500S | 2004 | for UF200 | ||
| B21 | ASSEMBLY | GRINDER | OKAMOTO | DNX12PB | 8 | 2008 | ||
| B22 | ASSEMBLY | DICER | DISCO | DAC552 | 4 | 2004 | ||
| B23 | ASSEMBLY | DICER | DISCO | DAD522 | 4,6 | 2000 | ||
| B24 | ASSEMBLY | DICER | DISCO | DAD3350 | 6 | 2004 | ||
| B25 | ASSEMBLY | DICER | DISCO | DFD6340 | 角基板 | 2017 | ||
| B26 | ASSEMBLY | DICER | DISCO | DFD6340 | 8 | 2009 | ||
| B27 | ASSEMBLY | DICER | DISCO | DFD6360 | 350mm | 2002 | ||
| B28 | ASSEMBLY | DICER | DISCO | DFD6361 | 8 | 2006 | ||
| B29 | ASSEMBLY | DICER | DISCO | DFD6361 | 8 | 2007 | ||
| B30 | ASSEMBLY | DICER | DISCO | DFD640 | 8 | 1997 | 21433h | |
| B31 | ASSEMBLY | DICER | DISCO | DFD641 | 6 | |||
| B32 | ASSEMBLY | DICER | DISCO | DFD651 | 4 | 1998 |