Turnkey
		
		
			
				
								
					
 
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Nikon stepper NSR2205 i14
                        - Wafer size: 150mm or 200mm , Flat and notch wafers
 - Resolution: 0.35um 
 - Focus Repeatability: within 0.08um (3σ)
 - Distortion: Within+/-0.04um
 - ORT: Within +/-0.1 sec
 - Uniformity: less than <1.5% 
 - Intensity: More than 650 mw/cm2
 - Reticle blind: 0.4mm~0.8mm (on reticle)
 - Wafer flatness: Within 2.5um
 - Stepping: 3σ within 0.03um
 
						
					 
				
                				
					
 
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Nikon stepper NSR2205 i12
                        - Wafer size: 50mm,100mm ,150mm or 200mm , Flat and notch wafers
 - Resolution: 0.35um 
 - Focus Repeatability: within 0.15um (3σ)
 - Distortion: Within+/-0.04um
 - ORT: Within +/-0.1 sec
 - Uniformity: less than <1.5% 
 - Intensity: More than 600 mw/cm2
 - Reticle blind: 0.4mm~0.8mm (on reticle)
 - Wafer flatness: Within 2.5um
 - Stepping: 3σ within 0.04um
 
						
					 
				
                				
					
 
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Nikon stepper NSR2205 i11
                        - Wafer size: 50mm,100mm ,150mm or 200mm , Flat and notch wafers
 - Resolution: 0.4um 
 - Focus Repeatability: within 0.15um (3σ)
 - Distortion: Within+/-0.045um
 - ORT: Within +/-0.1 sec
 - Uniformity: less than <1.5% 
 - Intensity: More than 600 mw/cm2
 - Reticle blind: 0.4mm~0.8mm (on reticle)
 - Wafer flatness: Within 2.5um
 - Stepping: 3σ within 0.05um
 
						
					 
				
                				
					
 
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Nikon stepper NSR2005 i10
                        - Wafer size: 50mm,100mm ,150mm or 200mm , Flat and notch wafers
 - Resolution: 0.45um 
 - Depth of focus: <0.6um
 - Distortion: Within+/-0.6um
 - ORT: Within +/-0.1 sec
 - Uniformity: less than <1.5%
  - Intensity: More than 550 mw/cm2
 - Reticle blind: 0.4mm~0.8mm (on reticle)
 - Wafer flatness: Within 2.5um
 - Stepping: 3σ within 0.065um
 
						
					 
				
                				
					
 
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Nikon stepper NSR2005 i9
                        - Wafer size: 50mm,100mm ,150mm or 200mm , Flat and notch wafers
 - Resolution: 0.5um 
 - Depth of focus: <0.6um
 - Distortion: Within+/-0.65um
 - ORT: Within +/-0.15 sec
 - Uniformity: less than <1.5% 
 - Intensity: More than 500 mw/cm2
 - Reticle blind: 0.4mm~0.8mm (on reticle)
 - Wafer flatness: Within 2.5um
 - Stepping: 3σ within 0.065um
 
						
					 
				
                				
					
 
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Nikon stepper NSR2005 i8
                        - Wafer size: 50mm,100mm ,150mm or 200mm , Flat and notch wafers
 - Resolution: 0.5um (8 inch wafer)
 - Depth of focus: <0.6um
 - Distortion: Within+/-0.07um
 - ORT: Within +/-0.2 sec
 - Uniformity: less than <2% 
 - Intensity: More than 500 mw/cm2
 - Pre-alignment accuracy: 3sigma<5um
 - Wafer flatness: within +/-1.5sec
 - Stepping: 3σ within 0.07um
 
						
					 
				
                				
					
 
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Nikon stepper NSR1755 i7
                        - Wafer size: 50mm,100mm ,150mm or 200mm , Flat and notch wafers
 - Resolution: 0.55um (8 inch wafer)
 - Depth of focus: <0.6um
 - Distortion: Within+/-0.08um
 - Astigmatism: less than 2.0 μm
 - Uniformity: less than <2% 
 - Intensity: More than 500 mw/cm2
 - Pre-alignment accuracy: 3sigma<5um
 - Chip leveling (accuracy): within +/-1.5sec
 - Stepping: 3σ within 0.08um